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Handbook of Silicon Semiconductor Metrology

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Handbook of Silicon Semiconductor...

Handbook of Silicon Semiconductor Metrology

Ed. Alain C Diebold

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Frontmatter

Έτος:

2007

Γλώσσα:

spanish

ISBN 10:

0824705068

ISBN 13:

9780824705060

Αρχείο:

MOBI , 19.70 MB

IPFS:

,

spanish, 2007

Αυτό το βιβλίο δεν είναι διαθέσιμο για λήψη λόγω καταγγελίας του κατόχου των πνευματικών δικαιωμάτων

Beware of he who would deny you access to information, for in his heart he dreams himself your master

— Pravin Lal

Ίσως σας ενδιαφέρει

Y. Naka, K. Sugawara, C. McGreavy — Introduction to VLSI Process Engineering

Yale Strausser — Characterization of Silicon Processing (Materials Characterization)

David G. Seiler, Alain C. Diebold, Thomas J. Shaffner, Robert McDonald, W. Murray Bullis, Patrick J. Smith, Erik M. Secula — Characterization and Metrology for ULSI Technology 2000: International Conference (AIP Conference Proceedings)

A. Mignani, et al., — Sensors and Microsystems [Procs, 10th Italian Conf.]

Unknown — "Chemical Vapor Deposition". In: Wiley Encyclopedia of Electrical and Electronics Engineering

Clark, Jesse L — Forms control

coll. — Semiconductor Strain Metrology

John M. Andrews and George K. Celler (Editors) — ULSI Science and Technology 1991

Strausser, Yale — Characterization in Silicon Processing

Norman G Einspruch; Graydon B Larrabee — Materials and process characterization

Krishna Seshan，Dominic Schepis — Handbook of Thin Film Deposition (Fourth Edition)

Michael Quirk, Julian Serda — Semiconductor Manufacturing Technology

Stephen A. Campbell — Fabrication Engineering at the Micro- and Nanoscale

Coffa, S.; Ferla, G.; Priolo, F; Rimini, E. (eds.) — Ion Implantation Technology-94: Proceedings of the Tenth International Conference on Ion Implantation Technology Catania, Italy, June 13-17, 1994

G.M. Crean,M. Locatelli,J. McGilp — Acoustic, Thermal Wave and Optical Characterization of Materials

G.M. Crean, R. Stuck and J.A. Woollam (Eds.) — Semiconductor Materials Analysis and Fabrication Process Control

D.F. Downey, M. Farley, K.S. Jones and G. Ryding (Eds.) — Ion Implantation Technology–92

Dieter K. Schroder — Semiconductor Material and Device Characterization

John G. Webster (Editor) — 54.Semiconductor Manufacturing

Sorin Cristoloveanu, Sheng S. Li (auth.) — Electrical Characterization of Silicon-on-Insulator Materials and Devices

George A. Brown (Editor) Dinesh C. Gupta (Editor) — Gate Dielectric Integrity: Material, Process, and Tool Qualification (ASTM Special Technical Publication, 1382)

Krisna Seshan (Eds.) — Handbook of Thin Film Deposition Processes and Techniques. Principles, Methods, Equipment and Applicatios

Xiao, Hong — Introduction to Semiconductor Manufacturing Technology (2nd Edition)

Hong Xiao — Introduction to Semiconductor Manufacturing Technology

Subramanian S. Iyer, Subramanian S. Iyer, Andre J. Auberton-Herve — Conference on Earth Station Technology, 14-16 October 1970

ASM International — ISTFA 2002: proceedings of the 28th International Symposium for Testing and Failure Analysis

ASM — ISTFA 2006: proceedings of the 32nd International Symposium for Testing and Failure Analysis

Kumar Shubham, Ankaj Gupta — Integrated Circuit Fabrication

Electrochemical Society — Ulsi Science And Technology: Proceedings of the 5th International Symposium Held May 1995

Yoshio Nishi, Robert Doering — Handbook of Semiconductor Manufacturing Technology

Tejinder Gandhi (editor) — Microelectronics Failure Analysis Desk Reference

Henry H. Radamson, Anders Hallén, Ilya Sychugov, Alexander Azarov — Analytical Methods and Instruments for Micro- and Nanomaterials

Jan Grym — Semiconductor Technologies

Stephen Saddow, Francesco La Via — Advanced Silicon Carbide Devices and Processing

— Sensors And Microsystems: Proceedings of the 10th Italian Conference Firenze, Italy 15-17 February 2005

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